The fundamental test of a laser diode is a Light-Current-Voltage (LIV) curve, which simultaneously measures the electrical and optical output power characteristics of the device. This test is primarily used to sort laser diodes or weed out bad devices before they can be built into an. Laser diodes can generally be expected to reach long lifetimes, often many tens of thousands of operation hours. Nevertheless, or actually just to reach such high reliability, they need to be tested under various circumstances: When the fabrication process is developed and qualified, particularly. An important aspect of the development and manufacture of laser diodes is the so-called laser diode characterization, or laser IV curve. CT6206 is a very flexible test platform that supports CoC, CoS, CoB or TO packages, covering optical communications, industry, 3D sensors, laser radar and other applications. This paper presents reliable high power and high brightness 9xx-nm single emitter laser diodes, which have been designed for various multi-emitter fiber-coupled modules. Diode lasers from legend generation have been life-tested with currents up to 14A at heat-sink and junction temperatures of 50°C.